“Reality is merely an illusion,
albeit a very persistent one.”
Albert Einstein
transformation in BaTiO3
credit: R. Ignatans
Top-Right: Electrochemical chip
Bottom-Right: Cross-section of liquid/gas cell enclosure
credit: R. Girod
enclosed in air
credit: T.-H. Shen
Our mission at INE is to understand on a fundamental level the nanoscale properties of functional oxides and 2D materials using in situ transmission electron microscopy techniques. We focus on nucleation and growth, phase transformations, surface reconstructions, and degradation mechanisms of nanostructures and we probe how the nanomaterials properties are affected by changes in temperature, electric field, and gaseous and/or liquid environment. We develop the techniques in order to dynamically observe the changes as they happen during real-time operation of their bulk counterparts. Such measurements have important implications on the design and development of electrochemical storage systems and memory devices.
News
Electrochemical TEM Publication Highlighted
Robin’s article is highlighted in Microscopy Today.
Assessing the Inert Potential Range in Carbon Chips for in situ Electrocatalytic TEM Measurements
Robin’s article on the “Electrochemical behavior of carbon chips for in situ redox studies in a transmission electron microscope” is published in Microscopy and Microanalysis. To view the article please follow this link.
Award for Ferroelectric Domain Probing
The Best Student Paper Award of the European Meeting of Ferroelectricity (EMF) at f2cπ2 2019 was awarded to Reinis for his work on dynamic ferroelectric domain probing!